Tender Notice

Tender Detail

Thin Film Thickness/Stress Metrology System, 3D topography measurement System and Non-Pattern Defect Inspection Metrology System(2)

Tendering Authority
Tender Category
Other
Publish Date
03 Mar 2021
Deadline
24 Mar 2021
Country \ State
China
TenderNews Ref. No.
1762917210303-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.

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