Tender Notice

Tender Detail

Semi-automatic test system for multi-site wafer-level reliability testing (including semi-automatic tester and probe station equipment) (2)

Tendering Authority
Tender Category
Other
Publish Date
18 Jun 2025
Deadline
08 Jul 2025
Country \ State
China
TenderNews Ref. No.
608516250618-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.

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