Tender Notice

Tender Detail

Focused ion beam field emission scanning electron microscope dual beam system

Tendering Authority
Tender Category
Other
Publish Date
11 Jul 2020
Deadline
31 Jul 2020
Country \ State
China
TenderNews Ref. No.
922617200711-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.

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