| 4898016260918 |
18-Sep-2026 |
29-Sep-2026 |
India / KERALA |
Refer Document. |
Tender For Clamping Specimen Holder- D 50mm, Complete,Multiple EBSD sample holder- 70/53.5 deg
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| 2931616260915 |
15-Sep-2026 |
21-Sep-2026 |
India / MADHYA PRADESH |
INR 18290000 |
Tender For SITC of Electron Backscattered Diffraction (EBSD) attachment for FESEM.
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| 1974416260912 |
12-Sep-2026 |
21-Oct-2026 |
India / Maharashtra |
Refer Document. |
Tender For Field Emission Scanning Electron Microscope (FE-SEM) with EDS and EBSD
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| 2317916260905 |
05-Sep-2026 |
07-Oct-2026 |
Czech Republic |
CZK 31452000 |
Tender For Faculty of Science/Department of Experimental Physics - FIB-SEM System including analytical techniques and nanoindentation
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| 4161516260827 |
27-Aug-2026 |
30-Sep-2026 |
Poland |
Refer Document. |
Tender For Sale and delivery of equipment, instruments, and laboratory accessories for the Laboratory of Electron Microanalysis, Microprobe, and X-ray Diffraction
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| 3006216260819 |
19-Aug-2026 |
22-Sep-2026 |
Czech Republic |
CZK 31452000 |
Tender For UPOL/Faculty of Science/Department of Experimental Physics - FIB-SEM System including analytical techniques and nanoindentation
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| 4047916260307 |
07-Mar-2026 |
N/A |
Spain |
EUR 932397 |
Tender For Supply of a Dual Beam Electron Microscope with EBSD Detector and Electron (EBL) and Focused Ion (FIB) Nanolithography Systems.
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| 4537916260307 |
07-Mar-2026 |
N/A |
Netherlands |
Refer Document. |
Tender For Market consultation EDX and EBSD
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| 3261816240304 |
04-Mar-2024 |
N/A |
Czech Republic |
Refer Document. |
Tender For Xenon Focused Ion Beam Electron Microscope
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